X-ray diffractometer

All models in the series are suitable for either suspended filament (negative high voltage polarity) or grounded filament (positive high voltage polarity)

The principle is based on the interaction of X-rays with matter, where atoms within the object scatter the incident radiation. Each atom acts as a source of scatd waves, and the interference of these waves results in diffraction. This technique is primarily employed for qualitative and quantitative phase analysis, enabling the precise determination of crystal structures, lattice parameters, and sress states. Widely utilized in materials science, geological exploration, pharmaceuticals, and the chemical industry, it serves as an indispensable analytical tool for substance identification, quality control, and the istigation of material microstructures in both research and industrial settings