X-ray Fluorescence analysis

X-ray fluorescence analysis (XRF) technology, it is a method that uses primary x-ray photons or other microscopic particles to excite the atoms in the sample and make them produce fluorescence (secondary x-ray) . When an atom is ionized by an X-ray photon (primary x-ray) or other particle, the electrons in the inner layer of the atom are recoordinated, the transition of an outer electron to an inner electron vacancy and the emission of a secondary x-ray photon, which is X-ray fluorescence: the energy released by the transition of an outer electron to an inner electron vacancy is equal to the energy difference between the two electron energy levels, so the wavelength of X-ray fluorescence is different for different elements.